As the industry’s first test cable assembly capable of stable signal transmission up to 250 GHz, the new 0.5 mm connector cable “MWX0A5” is designed for high-frequency measurement environments that require precision, stability, and reliability. Developed in collaboration with Keysight Technologies, it is an ideal solution for applications such as semiconductor devices in AI-related chip characterization and sub-THz research, supporting transmission from DC to 250 GHz.
Its low insertion loss—achieved through a custom dielectric layer—and excellent return loss maintains signal quality even at the upper limits of the frequency band. The 0.5 mm NMD female connector is more robust than standard connectors, and a 0.5–1.0 mm adapter is available for compatibility with common DUT interfaces.
Features
- Capable of transmitting from DC to 250 GHz for high-frequency testing applications
- PTFE tape-dielectric construction achieves low insertion loss, approximately -7 dB at 250 GHz for a 6-inch (152 mm) length.
- Excellent return loss across the full frequency range minimizes signal reflection and maintains performance at high frequencies
- Supports next-generation DUTs, including AI accelerator chips and advanced semiconductor devices, even before 0.5 mm interfaces become widespread
Use
- Testing and evaluation of semiconductor devices
- Probe-station evaluation of AI accelerator chips and other high-performance devices
- Millimeter-wave (mmWave) and sub-THz research applications
- Precision measurement setups requiring low-loss, high stability interconnects
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