Junkosha Microwave/mmWave Coaxial Cable Assembly
[MWX0A5: 0.5 mm up to 250 GHz］
As the industry’s first test cable assembly capable of stable signal transmission up to 250 GHz, the new 0.5 mm connector cable “MWX0A5” features a robust 0.5 mm Ruggedized female connector and is designed for high-frequency measurement environments that require precision, stability, and reliability. Developed in collaboration with Keysight Technologies, it is an ideal solution for applications such as semiconductor devices in AI-related chip characterization and sub-THz research, supporting transmission from DC to 250 GHz. Its low insertion loss—achieved through a custom dielectric layer—and excellent return loss maintain signal quality even at the upper limits of the frequency band.
A 0.5 mm–1.0 mm adapter will be available for compatibility with common DUT interfaces.
[MWX009: 0.5 mm up to 190 GHz / 0.8 mm up to 167 GHz]
The MWX009 has been developed to support advanced probe system measurements using 0.5 mm and 0.8 mm connector interfaces, enabling operation up to 190 GHz and 167 GHz respectively. MWX009 delivers low insertion loss and excellent return loss performance, enabled by Junkosha’s custom PTFE dielectric layer technology, which provides superior signal integrity at extremely high frequencies. It also features a secure safety-lock connector for improved connection stability. Designed for sub-THz communication research and next-generation high-frequency development, the new MWX009 cable will support engineers to extend measurement capabilities up to 167 GHz.
As the industry’s first test cable assembly capable of stable signal transmission up to 250 GHz, the new 0.5 mm connector cable “MWX0A5” features a robust 0.5 mm Ruggedized female connector and is designed for high-frequency measurement environments that require precision, stability, and reliability. Developed in collaboration with Keysight Technologies, it is an ideal solution for applications such as semiconductor devices in AI-related chip characterization and sub-THz research, supporting transmission from DC to 250 GHz. Its low insertion loss—achieved through a custom dielectric layer—and excellent return loss maintain signal quality even at the upper limits of the frequency band.
A 0.5 mm–1.0 mm adapter will be available for compatibility with common DUT interfaces.
[MWX009: 0.5 mm up to 190 GHz / 0.8 mm up to 167 GHz]
The MWX009 has been developed to support advanced probe system measurements using 0.5 mm and 0.8 mm connector interfaces, enabling operation up to 190 GHz and 167 GHz respectively. MWX009 delivers low insertion loss and excellent return loss performance, enabled by Junkosha’s custom PTFE dielectric layer technology, which provides superior signal integrity at extremely high frequencies. It also features a secure safety-lock connector for improved connection stability. Designed for sub-THz communication research and next-generation high-frequency development, the new MWX009 cable will support engineers to extend measurement capabilities up to 167 GHz.
Features
[MWX0A5］
- Capable of transmitting from DC to 250 GHz for high-frequency testing applications
- PTFE tape-dielectric construction achieves low insertion loss, approximately -7 dB at 250 GHz for a 6-inch (152 mm) length
- Excellent return loss across the full frequency range minimizes signal reflection and maintains performance at high frequencies
- Paired with a 0.5 mm Ruggedized female connector for secure mating with 10 lb-in torque
[MWX009]
- Capable of transmitting from DC to 190 GHz for high-frequency testing applications
- Paired with a 0.8 mm connector to access 0.8 mm probe or DUT for measurements up to 167 GHz
- PTFE dielectric construction achieves low insertion loss of approximately -4.7 dB at 190 GHz for a 6-inch (152 mm) length
- Excellent return loss across the full frequency range minimizes signal reflection and maintains high-frequency performance
- Proprietary locking mechanism ensures secure and repeatable connections
- Capable of transmitting from DC to 250 GHz for high-frequency testing applications
- PTFE tape-dielectric construction achieves low insertion loss, approximately -7 dB at 250 GHz for a 6-inch (152 mm) length
- Excellent return loss across the full frequency range minimizes signal reflection and maintains performance at high frequencies
- Paired with a 0.5 mm Ruggedized female connector for secure mating with 10 lb-in torque
[MWX009]
- Capable of transmitting from DC to 190 GHz for high-frequency testing applications
- Paired with a 0.8 mm connector to access 0.8 mm probe or DUT for measurements up to 167 GHz
- PTFE dielectric construction achieves low insertion loss of approximately -4.7 dB at 190 GHz for a 6-inch (152 mm) length
- Excellent return loss across the full frequency range minimizes signal reflection and maintains high-frequency performance
- Proprietary locking mechanism ensures secure and repeatable connections
Use
[MWX0A5］
- Testing and evaluation of semiconductor devices
- Probe-station evaluation of AI accelerator chips and other high-performance devices
- Millimeter-wave (mmWave) and sub-THz research applications
- Precision measurement setups requiring low-loss, high-stability interconnects
[MWX009]
- Testing and evaluation of semiconductor devices
- Probe-station evaluation of AI accelerator chips and other high-performance devices
- Millimeter-wave (mmWave), particularly D-band research applications
- Testing and evaluation of semiconductor devices
- Probe-station evaluation of AI accelerator chips and other high-performance devices
- Millimeter-wave (mmWave) and sub-THz research applications
- Precision measurement setups requiring low-loss, high-stability interconnects
[MWX009]
- Testing and evaluation of semiconductor devices
- Probe-station evaluation of AI accelerator chips and other high-performance devices
- Millimeter-wave (mmWave), particularly D-band research applications
S parameter measurement, measured by Keysight Technologies
MWX0A5 cable connected to Keysight extenders
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